Beilstein J. Nanotechnol.2014,5, 1864–1872, doi:10.3762/bjnano.5.197
sputtering and local defects are produced by Sn) leading to the synthesis and burrowing of Pt NPs is evidenced. The Pt NP synthesis mechanism and their burrowing into the silicon is discussed in detail.
Keywords: atomic force microscopy; burrowingofnanoparticles; medium-energy ion irradiation; nuclear and
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Figure 1:
Electronic and nuclear stopping vs ion energy (SRIM calculation for neon ions incident on Pt).